发明名称 |
Phase shift mask, method of exposure, and method of producing semiconductor device |
摘要 |
A phase shift mask including a first phase shifter through which light passes by a first optical path length; a second phase shifter through which light passes by a second optical path length inverted in an optical phase from the first optical path length, the second phase shifter formed away from the first phase shifter by a predetermined distance; a light-blocking part formed around the first phase shifter and second phase shifter; and a correction pattern provided at a part of at least one of the first phase shifter and second phase shifter for correcting a distribution of light intensity between light passing through the first phase shifter and light passing through the second phase shifter, and method of exposure and method of producing a semiconductor device using the phase shift mask. |
申请公布号 |
KR100870623(B1) |
申请公布日期 |
2008.11.27 |
申请号 |
KR20020028952 |
申请日期 |
2002.05.24 |
申请人 |
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发明人 |
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分类号 |
G03F1/08;H01L21/027;G03F1/00;G03F1/30;G03F1/34;G03F1/36;G03F1/68;G03F7/20 |
主分类号 |
G03F1/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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