发明名称 APPARATUS AND METHOD FOR FLUORESCENT X-RAY ANALYSIS AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To provide a fluorescent X-ray analysis apparatus capable of highly reliably detecting positional displacements of a sample 10. SOLUTION: The fluorescent X-ray analysis apparatus is provided with a stage 22 for mounting the sample 10, a measuring apparatus 2 having a casing for housing the stage 22 and provided with a cover which can be opened and closed to perform measurement by irradiating the sample 10 with X rays and detecting fluorescent X rays from the sample 10, an imaging device 3 for imaging the same part of the sample 10 and acquiring the first and second image data before and after the cover is closed after the sample 10 is mounted onto the stage 22 with the cover open, a positional displacement detection part 13 for detecting positional displacements of the sample 10 through the use of the first and second image data, and a reporting part 14 for reporting positional displacements. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008286554(A) 申请公布日期 2008.11.27
申请号 JP20070129722 申请日期 2007.05.15
申请人 SHIMADZU CORP 发明人 OTAGURO ATSUHIKO
分类号 G01N23/223 主分类号 G01N23/223
代理机构 代理人
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