发明名称 EQUIPMENT STATE MONITORING DEVICE AND EQUIPMENT STATE MONITORING METHOD AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To safely and easily monitor equipment circumstances using a monitor logic. SOLUTION: This equipment state monitoring device is configured to collect sensor data detected by one or more sensors which observe equipment; to perform two or more monitor logics for monitoring the state of the equipment, based on the collected sensor data, and to acquire an equipment state value, showing the state of the equipment from each monitor logic; to output an equipment state value acquired from a selected monitor logic as a monitor logic shown by monitor logic selection information acquired, by selecting any of the two or more monitor logics; and to calculate a distance between the distribution of the equipment state value, acquired from the selected monitor logic and the distribution of the equipment state value acquired from one or more other monitor logics different from the selected monitor logic; and to, when the number of the other monitor logics, having distribution whose distance with the distribution of the selected monitor logic is large, is a threshold or larger, rewrite the monitor logic selection information so that any of the other monitor logics can be selected. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008287495(A) 申请公布日期 2008.11.27
申请号 JP20070131755 申请日期 2007.05.17
申请人 TOSHIBA CORP 发明人 IMAHARA SHUICHIRO;SUYAMA AKIHIRO
分类号 G05B23/02 主分类号 G05B23/02
代理机构 代理人
主权项
地址
您可能感兴趣的专利