| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a nonvolatile memory device and system including a re-mapped bad block address, and a method of operating the same. <P>SOLUTION: The method of operating the nonvolatile memory device included in a memory card can be provided by re-mapping addresses of bad blocks in a first nonvolatile MAT in the memory card and re-mapping addresses of bad blocks in a second nonvolatile MAT in the memory card. The second nonvolatile MAT includes the blocks address-mapped with blocks in the first nonvolatile MAT. Also, a method of scanning the nonvolatile memory device for the bad blocks can be provided by sequentially scanning blocks in the nonvolatile memory device for data indicating that a respective block is a bad block starting at a starting block address that is above a lowermost block address of the nonvolatile memory device. In this case, the starting block address is based on a yield for the nonvolatile memory device. <P>COPYRIGHT: (C)2009,JPO&INPIT</p> |
