| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a technology for reducing the generation of any delay failure in a semiconductor integrated circuit. <P>SOLUTION: This design support device of a semiconductor circuit is provided with: an attribute information acquisition part for acquiring the attribute information of a circuit to be inspected; a delay failure specification part for specifying a delay failure generation section where any delay failure is likely to generate in the circuit to be inspected based on the attribute information acquired by the attribute information acquisition part; and a delay prevention part for taking measures to reduce the generation of the delay failure to the delay failure generation section specified by the delay failure specification part. <P>COPYRIGHT: (C)2009,JPO&INPIT</p> |
