IC CIRCUIT WITH TEST ACCESS CONTROL CIRCUIT USING A JTAG INTERFACE,申请号EP20070735016-传众专利搜索

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发明名称	IC CIRCUIT WITH TEST ACCESS CONTROL CIRCUIT USING A JTAG INTERFACE
摘要
申请公布号	EP1994421(A2)	申请公布日期	2008.11.26
申请号	EP20070735016	申请日期	2007.02.21
申请人	KONINKLIJKE PHILIPS ELECTRONICS N.V.	发明人	VAN DE LOGT, LEON
分类号	G01R31/3185	主分类号	G01R31/3185
代理机构		代理人
主权项
地址

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