CONNECTING APPARATUS FOR SEMICONDUCTOR DEVICE TEST SYSTEM

摘要

A connecting device of a test system for a semiconductor device is provided to accurately make the contact between the pins by making the connecting device for being adopted in the HI-fix apparatus to be individual and moveable to each axis. A connecting device of a test system for a semiconductor device comprises the system board in which more than 2 pin groups are arranged side by side; the baseboard assembly including each system board connector which is bonded or separated to/from the system board connector; the main shelf(310) which is arranged horizontally with an interval in the upper of the baseboard assembly; the alignment unit inducing the exact pin bond between the system board connector and the system board connector; the suspension bearing unit for supporting the baseboard assembly.