| 摘要 |
A monitor burn-in system parallely mounted on a burn-in board is provided to remove a time delay and a distortion by transmitting a test signal produced in a driving part into each memory chip. A monitor burn-in system parallely mounted on a burn-in board comprises a driving part, a controller, and a testing part. The driving part is individually allocated in a plurality of memory devices. The driving part produces a test signal during a write mode, and reads a test data recorded in a memory device during a read-out mode. The controller(20) controls a mode of memory devices, and provides a driving signal for determining a level of the test signal to each driving part. The testing part(40) inspects a failure state of the memory devices by comparing the test data recorded in the memory devices with the test data. |
