发明名称 Structure for transistor devices in an SRAM cell
摘要 An SRAM memory cell having first and second transfer gate transistors. The first transfer gate transistor includes a first source/drain connected to a bit line and the second transfer gate transistor has a first source/drain connected to a complement bit line. Each transfer gate transistor has a gate connected to a word line. The SRAM memory cell also includes first and second pull-down transistors configured as a storage latch. The first pull-down transistor has a first source/drain connected to a second source/drain of said first transfer gate transistor; the second pull-down transistor has a first source/drain connected to a second source/drain of said second transfer gate transistor. Both first and second pull-down transistors have a second source/drain connected to a power supply voltage node. The first and second transfer gate transistors each include a gate oxide layer having a first thickness, and the first and second pull-down transistors each include a gate oxide layer having a second thickness, wherein and the first thickness is different from the second thickness.
申请公布号 USRE40579(E1) 申请公布日期 2008.11.25
申请号 US20000694051 申请日期 2000.10.20
申请人 STMICROELECTRONICS, INC. 发明人 BRYANT FRANK RANDOLPH;CHAN TSIU CHIU
分类号 H01L29/76;H01L29/94;H01L31/00 主分类号 H01L29/76
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