发明名称 Method of improving grating test pattern for lithography monitoring and controlling
摘要 A method of making a process monitor grating pattern for use in a lithographic imaging system comprises determining minimum resolvable pitch of a plurality of spaced, adjacent line elements, and selecting a process monitor grating period that is an integer multiple M, greater than 1, of the minimum resolvable pitch. The method then includes designing a process monitor grating pattern having a plurality of adjacent sets of grouped line elements spaced from each other. Each set of grouped line elements is spaced from and parallel to an adjacent set of grouped line elements by the process monitor grating period, such that when the process monitor grating pattern is projected by the lithographic imaging system the line elements in each set are unresolvable from each other and Fourier coefficients of diffracted orders m created by the line elements in the range of 1<|m|<=M are zero.
申请公布号 US7455939(B2) 申请公布日期 2008.11.25
申请号 US20060461217 申请日期 2006.07.31
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BRUNNER TIMOTHY A.;AUSSCHNITT CHRISTOPHER P.
分类号 G03F9/00 主分类号 G03F9/00
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