发明名称 APPARATUS OF TRANSFERRING TEST TRAY, TEST HANDLER HAVING THE SAME, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME
摘要 An apparatus for transferring the test tray, a test handler having the same, and a method for manufacturing the semiconductor device using the same are provided to improve the productivity by transferring two test trays at the same time. An apparatus for transferring the test tray comprises the first transport mechanism(310) including the contact surface which pushes the first test tray in order to transfer; the second transport mechanism(320) including the barrier groove which pulls the second test tray in order to transfer. The first transport mechanism contacts with the one side of the first test tray(T). The second transport mechanism unites with the jaw of the second test tray. The first transport mechanism and the second transport mechanism can move the test tray at the same time.
申请公布号 KR20080102073(A) 申请公布日期 2008.11.24
申请号 KR20070048412 申请日期 2007.05.18
申请人 MIRAE CORPORATION 发明人 KIM, YONG SUN
分类号 H01L21/68;G01R31/26 主分类号 H01L21/68
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