| 摘要 |
A semiconductor memory device including a repair fuse part and an improved repair address monitoring part is provided to improve a reliability of a repair address monitoring operation of a semiconductor memory device. A semiconductor memory device including a repair fuse part and an improved repair address monitoring part comprises the followings: an X repair fuse part(410) outputting X repair signal if the same address as repaired X address is inputted; an Y repair fuse part(420) outputting Y repair signal if the same address as repaired Y address is inputted; and an repair address monitoring part(430) outputting a repair informing signal which informs that the corresponding address was repaired. The repair address monitoring part answers to X repair signal in a first test mode, and answers to Y repair signal in a second test mode. |
