发明名称 CONTACT ELECTRODE FOR MEASURING ELECTRICAL CHARACTERISTIC OF THIN-LAYER TYPE DEVICES
摘要 A contact electrode having an elasticity corresponding to an intensity of organic material is provided to use a contact electrode for a long time by unchanging a form although an electrode contacts in an electrode of a thin film type device. A contact electrode(30a) having an elasticity corresponding to an intensity of organic material comprises a measuring device connection part(33), a contact part(32a), and an electrode part(31) formed with a conductive material. The contact electrode is formed in one end of the electrode part. The measuring device connection part has a diameter which is bigger than a diameter of the electrode part, is made of a material like the electrode part. The contact unit is formed by fusing or bending one end of the electrode part.
申请公布号 KR20080100952(A) 申请公布日期 2008.11.21
申请号 KR20070047027 申请日期 2007.05.15
申请人 UNIVERSITY-INDUSTRY COOPERATION GROUP OF KYUNG HEE UNIVERSITY 发明人 KIM, HONG DOO
分类号 G01R1/067;G01R31/00 主分类号 G01R1/067
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