发明名称 Ultra Thin Channel (UTC) MOSFET Structure Formed on BOX Regions Having Different Depths and Different Thicknesses Beneath the UTC and SourceDrain Regions and Method of Manufacture Thereof
摘要 A MOSFET structure includes a planar semiconductor substrate, a gate dielectric and a gate. A UT SOI channel extends to a first depth below the top surface of the substrate and is self-aligned to and is laterally coextensive with the gate. Source-drain regions, extend to a second depth greater than the first depth below the top surface, and are self-aligned to the UT channel region. A BOX 1 region extends across the entire structure, and vertically from the second depth to a third depth below the top surface. An upper portion of a BOX 2 region under the UT channel region is self-aligned to and is laterally coextensive with the gate, and extends vertically from the first depth to a third depth below the top surface, and where the third depth is greater than the second depth.
申请公布号 US2008283918(A1) 申请公布日期 2008.11.20
申请号 US20080166285 申请日期 2008.07.01
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHENG KANGGUO;CHIDAMBARRAO DURESETI;GREENE BRIAN JOSEPH;MANDELMAN JACK A.;RIM KERN
分类号 H01L29/786;H01L21/336 主分类号 H01L29/786
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