| 摘要 |
In order to provide a jig for surface enhanced vibrational spectroscopic analysis which can measure weak Raman scattered light or weak infrared absorption at high sensitivity and a method of manufacturing the jig, a structure for supporting a sample to be subjected to the surface enhanced vibrational spectroscopic analysis according to the present invention includes a substrate, a ground film formed on the substrate, and a base formed on the ground film. The base includes a plurality of holes formed in a direction perpendicular to the substrate. Metal fine particles are exposed on inner surfaces of the holes formed in the base and on a surface of the base. |
