发明名称 |
Test interface with a mixed signal processing device |
摘要 |
The present invention relates to a test interface to which a mixed signal processing circuit is integrated, and more particularly to a test interface of a probe card or a DUT card to which a mixed signal processing circuit is integrated, and the mixed signal processing circuit is integrated to pin electronic channels of a tester and the operation process of the mixed signal processing circuit is integrated to the system software of the tester.
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申请公布号 |
US2008284454(A1) |
申请公布日期 |
2008.11.20 |
申请号 |
US20070979511 |
申请日期 |
2007.11.05 |
申请人 |
KING YUAN ELECTRONICS CO., LTD. |
发明人 |
CHIH CHEN-CHIEN;LIAO CHUN-CHEN |
分类号 |
G01R31/26;G01R1/06 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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