发明名称 TEST PROGRAM UNIT SYSTEM AND TESTING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a testing apparatus for efficiently testing a plurality of signals. SOLUTION: In a digitizer device 40, a plurality of ADCs 102a and 102b convert a plurality of analog signals outputted from a device under test into digital signals. A processing circuit 110 is constituted as a software-dependent type circuit and processes a plurality of digital signals outputted from the plurality of ADCs 102a and 102b. The processing circuit 110 is formed in an FPGA 100. In the processing circuit 110, an FFT circuit 114 performs complex Fourier transformation on two digital signals. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008281354(A) 申请公布日期 2008.11.20
申请号 JP20070123568 申请日期 2007.05.08
申请人 ADVANTEST CORP 发明人 SATO NORIMASA;INABA KENJI
分类号 G01R31/316 主分类号 G01R31/316
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