发明名称 Einkristall-Ziehverfahren
摘要 A single crystal pulling method employing; a gas tight container, a double crucible for storing a semiconductor melt inside the gas tight container comprising an inter-connected outer crucible and inner crucible, and a source material supply tube suspended from an upper portion of the gas tight container and positioned so that a granulated or powdered source material can be added from a lower end opening thereof to the semiconductor melt inside the outer crucible, with the source material being injected into the source material supply tube together with an inert gas flowing towards the enclosed container, characterized in that said source material is injected under conditions where the flow rate N (1/minxcm2) of the inert gas is within the range 0.0048P+0.0264<N<0.07P, where P (Torr) is the internal pressure inside said gas tight container.
申请公布号 DE19700498(B4) 申请公布日期 2008.11.20
申请号 DE1997100498 申请日期 1997.01.09
申请人 MITSUBISHI MATERIALS SILICON CORP.;MITSUBISHI MATERIALS CORP. 发明人 ATAMI, TAKASHI;TAGUCHI, HIROAKI;FURUYA, HISASHI;KIDA, MICHIO
分类号 C30B15/02;C30B15/12;C30B15/34 主分类号 C30B15/02
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