发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 A semiconductor device includes a first conductivity type well formed on a semiconductor substrate, and a first transistor and a second transistor formed on the well. The first transistor has first pocket regions containing a first conductivity type impurity and first source/drain regions containing a second conductivity type impurity, and the second transistor has second pocket regions containing a first conductivity type impurity and second source/drain regions containing a second conductivity type impurity, and executes an analog function. A concentration of the first conductivity type impurity contained in the source-side and the drain-side second pocket regions is lower than a concentration of the first conductivity type impurity included in the first pocket regions.
申请公布号 US2008283922(A1) 申请公布日期 2008.11.20
申请号 US20080020758 申请日期 2008.01.28
申请人 YAMASHITA KYOJI;IKOMA DAISAKU 发明人 YAMASHITA KYOJI;IKOMA DAISAKU
分类号 H01L29/00;H01L21/336 主分类号 H01L29/00
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