发明名称 Method and Circuit Provided for Measuring Very Low Intensity of Electric Current
摘要 The measurement of a very low intensity of an electric current is carried out by integrating the electric current over integration cycles having a time period ti and measuring a peak value of a sawtooth voltage at an integrated circuit output each time at the end of the integration cycle, whereat noise voltage components of a frequency above a cut-off frequency, which has a value of the order of magnitude (0.1x2pixti)<SUP>-1</SUP>, being parts of a voltage of a noise generated in an operational amplifier comprised in the integrated circuit are filtered out of the said sawtooth voltage and noise components, which have the origin in the high-frequency voltage components of Johnson noise, which appear in the low-frequency spectral part of the sawtooth voltage as aliasing, are subtracted from a filtered sawtooth voltage. A higher absolute accuracy of the measurement is achieved by means of a reduction of the direct as well as the aliasing contribution of the Johnson noise of the operational amplifier in the measuring circuit.
申请公布号 US2008284411(A1) 申请公布日期 2008.11.20
申请号 US20050664110 申请日期 2005.09.29
申请人 KUNC VINKO;ATANASIJEVIC-KUNC MAJA;VODOPIVEC ANDREJ 发明人 KUNC VINKO;ATANASIJEVIC-KUNC MAJA;VODOPIVEC ANDREJ
分类号 G01R19/00;G01R1/30 主分类号 G01R19/00
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