| 摘要 |
A method of determining at least one characteristic parameter of a resonant structure ( 4 ) comprising the following steps: firstly placing the resonant structure ( 4 ) at a location, said location being located in the far field of a first antenna ( 2 ) and in the far field of a second antenna ( 5 ), and secondly emitting electromagnetic waves (EEW) with different frequencies in a given frequency range by means of the first antenna ( 2 ) such that the emitted electromagnetic waves (EEW) are modified by the resonant structure ( 4 ) and modified electromagnetic waves (MEW) are achieved, and thirdly determining during a first determining step a first electric power-value being representative of the power associated with the emitted electromagnetic waves(EEW), and fourthly receiving the generated modified electromagnetic waves (MEW) by means of the second antenna ( 5 ) and fifthly determining during a second determining step a second electric power-value being representative of the power associated with the received modified electromagnetic waves(MEW), and sixthly determining the at least one characteristic parameter by using the first and second power-values determined during the first and second determining steps.
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