发明名称 Roundness measuring device, method and program for measuring roundness
摘要 A roundness measuring device obtains an eccentric position of a measured object with respect to a rotation axis in measuring roundness of the measured object by rotating and driving the measured object. The roundness measuring device includes: a measurement acquisition unit obtaining, as measurements, rotation angles of the measured object and distances from the rotation axis to a surface of the measured object, the distance corresponding to the rotating angle; and an eccentricity calculation unit setting a circular correction circle with its center position provided as variable parameters, calculating the center position of the correction circle that minimizes sum of squares of distances between each of the measurements and the correction circle, in a direction from each of the measurements toward the center position of the correction circle, and determining the center position of the correction circle as the eccentric position.
申请公布号 EP1992910(A2) 申请公布日期 2008.11.19
申请号 EP20080009027 申请日期 2008.05.15
申请人 MITUTOYO CORPORATION 发明人 KADOWAKI, SOICHI;KOJIMA, TSUKASA
分类号 G01B21/20 主分类号 G01B21/20
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