| 摘要 |
A semiconductor memory device is provided to decrease the number of test pin to half than that of conventional device by using only first address buffer in test. In a semiconductor memory device, a first address buffer(310) is used in a test mode and a normal mode and especially more addresses than normal mode are inputted to the first address buffer in the test mode. A second address buffer(320) is disabled in the test mode. In the normal mode, an address inputted through the first address buffer and the second address buffer is transmitted and the address inputted through the first address buffer is transmitted in the test mode.
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