Method, system and computer program product for improving efficiency in generating high-level coverage data for a circuit-testing scheme

摘要

A method, system and computer program product for generating a coverage model to describe a testing scheme for a simulated system are described. In a preferred embodiment, a simulated system is tested with a testing simulation program. A simple event database is generated with the testing simulation program. Results of a checker analysis from the testing with the testing simulation program are obtained, and coverage data is created from a coverage model configuration file, the simple event database and the results of the checker analysis.