发明名称 Chromatographic methods for measuring impurities in a gas sample
摘要 An improved chromatographic method for measuring impurities in a gas sample that allows extraction of a peak of impurity masked by the sample background. An impurity peak is extracted from the sample background and put in a second sample loop and the second sample loop volume is injected into a second separation column. A "slice" is taken from the sample background to fill the second sample loop and the "slice", whose width is preferably substantially equal to the impurities peak width, is injected into the second separation column. Another embodiment allows concentration of a predetermined impurity, thereby providing an improved precision on the results. The chromatographic method provides an improved measure of argon in oxygen, oxygen in argon and oxygen in hydrogen.
申请公布号 US7451634(B2) 申请公布日期 2008.11.18
申请号 US20060361068 申请日期 2006.02.22
申请人 SYSTEME ANALYTIQUE INC. 发明人 GAMACHE YVES;FORTIER ANDRE´
分类号 G01N30/04;G01N30/46;G01N30/88 主分类号 G01N30/04
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