发明名称 Method of forming a mask structure and method of forming a minute pattern using the same
摘要 In the method of forming a mask structure, a first mask is formed on a substrate where the first mask includes a first mask pattern having a plurality of mask pattern portions having openings therebetween and a second mask pattern having a corner portion of which an inner side wall that is curved. A sacrificial layer is formed on the first mask. A hard mask layer is formed on the sacrificial layer. After the hard mask layer is partially removed until the sacrificial layer adjacent to the corner portion is exposed, a second mask is formed from the hard mask layer remaining in the space after removing the sacrificial layer. A minute pattern having a fine structure may be easily formed on the substrate.
申请公布号 US7452825(B2) 申请公布日期 2008.11.18
申请号 US20060589372 申请日期 2006.10.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE DOO-YOUL;CHO HAN-KU;LEE SUK-JOO;YEO GI-SUNG;KOH CHA-WON;JUNG SUNG-GON
分类号 H01L21/44;H01L21/00;H01L21/027 主分类号 H01L21/44
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