发明名称 Semiconductor device that is advantageous in complex stress engineering and method of manufacturing the same
摘要 A semiconductor device according to an embodiment includes an insulated-gate field-effect transistor including a gate insulation film provided on a major surface of a semiconductor substrate, a gate electrode provided on the gate insulation film, and a source and a drain provided spaced apart in the semiconductor substrate such that the gate electrode is interposed between the source and the drain, a first contact wiring line which is provided on the source, a second contact wiring line which is provided on the drain, and a piezoelectric layer which is provided to cover the gate electrode and has one end and the other end connected between the first and second contact wiring lines.
申请公布号 US7453108(B2) 申请公布日期 2008.11.18
申请号 US20070654020 申请日期 2007.01.17
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 JIN ZHENGWU
分类号 H01L31/062 主分类号 H01L31/062
代理机构 代理人
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