FLAT GLASS DEFECT INFORMATION SYSTEM AND CLASSIFICATION METHOD

摘要

A glass defect information system and a classification method are provided to classify defects occurring during a glass substrate manufaturing process sequentially three times, thereby improving defect classification accuracy. A kine of a defect is distinguished by using a Bayesian classifier(ST 200). By using a defect identification result of the second classification, whether it is the third classification object defect is determined(ST 210). A defect is classified with a result of the second classification when it is not the third classification object defect(ST 220). When it is the third classification object defect, one dimensional vector data stored in a one dimensional vector data storage unit is loaded(ST 225), a defect is classified(ST 240) after the third classification by a figurative property and a brightness property of an input image is performed from one-dimentional vector data(ST 230).