Process for Measuring the Impedance of Electronic Circuits

摘要

The task underlying the invention, which concerns a method for measurement of impedance of electronic circuits, in which the input of the electronic circuit is acted upon by a high-frequency ac voltage with a measurement frequency f as test signal and from the reaction of the circuit to the test signal the impedance Z of the circuit is determined, in which a parameter S, which represents the value $S=\frac{Z-Z_0}{Z+Z_0}$ at a stipulated reference impedance Z₀, is produced by means of an analyzer with a reference impedance Z₀, and from this parameter S the impedance Z is determined, is to minimize the error in measuring the impedances by determining parameter S. This is solved by the fact that the measurement frequency f is set so that a minimal error DeltaZ is produced for Z.