发明名称 Static random acess memory device
摘要 Additional transistors P 1 and P 2 which are PMOS transistors are connected to load transistors PL 1 and PL 2 which are PMOS transistors such that drain electrodes of the additional transistors P 1 and P 2 and drain electrodes of the load transistors PL 1 and PL 2 are connected at a node 1 and a node 2 while gate electrodes of the additional transistors P 1 and P 2 and gate electrodes of the load transistors PL 1 and PL 2 are connected at the node 1 and the node 2 . A source electrode of the additional transistor P 1 is connected to an additional transistor control circuit, which is provided for each column. The additional transistor control circuit sets control signals S 1 and S 2 to the H level in other times than data write so that the additional transistor P 1 or P 2 compensates the load transistor PL 1 or PL 2 , thereby increasing the static margin. In data write, the additional transistor control circuit sets the control signals S 1 and S 2 to the low level, thereby preventing the additional transistors from hindering the data write, and thus increasing the write margin.
申请公布号 US2008278993(A1) 申请公布日期 2008.11.13
申请号 US20080149500 申请日期 2008.05.02
申请人 NEC ELECTRONICS CORPORATION 发明人 HAYASHI TAKUYA;YOKOYAMA YOSHISATO
分类号 G11C11/00;G11C8/16 主分类号 G11C11/00
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