发明名称 AMORPHOUS OXIDE SEMICONDUCTOR, SEMICONDUCTOR DEVICE AND THIN-FILM TRANSISTOR
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor and an element having excellent characteristics in an amorphous oxide semiconductor in which the composition ratios of In, Ga and Zn are expressed by In<SB>x</SB>Ga<SB>y</SB>Zn<SB>z</SB>, a semiconductor device and a thin-film transistor. <P>SOLUTION: In the amorphous oxide semiconductor in which the composition ratios of In, Ga and Zn are expressed by In<SB>x</SB>Ga<SB>y</SB>Zn<SB>z</SB>, its density (mass per unit volume) is not less than 0.94×(7.121x+5.941y+5.675z)/(x+y+z). <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2008277326(A) 申请公布日期 2008.11.13
申请号 JP20070115617 申请日期 2007.04.25
申请人 CANON INC 发明人 YABUTA HISATO;ENDO AYANORI;KACHI NOBUYUKI;HAYASHI SUSUMU
分类号 H01L29/786 主分类号 H01L29/786
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