发明名称 TEMPERATURE CONTROLLER FOR WAVELENGTH LOCKER, THE WAVELENGTH LOCKER AND OPTICAL MODULE
摘要 PROBLEM TO BE SOLVED: To find out, for each material quality, the optimum thickness of each width of an insulating plate for mounting a thermistor element, in order to enable stable wavelength control in which a shift amount of monitor wavelength is within±0.5 pm, even if the temperature of the environment changes. SOLUTION: The insulating plate should have a thermal conductivity different from that of an etalon element, whereΔT<SB>E</SB>is the change in temperature of the center portion of the etalon element;ΔT is the change in temperature of a surface of an insulating plate where a thermistor element is mounted; w1 is the width of the etalon element, t1 is its thickness; w2 is the width of the insulating plate and t2 is its thickness, w2 and t2 are set so that the relation between w2/w1 in which w2 is standardized by w1 and t2/t1, in which t2 is standardized by t1 and lies within a range surrounded by a solid line 1, representing the relation "ΔT=ΔT<SB>E</SB>+0.2°C" between w2/w1 and t2/t1 in a graph, in which w2/w1 represents the horizontal axis; and t2/t1 represents the vertical axis and a solid line 2 represent the relation "ΔT=ΔT<SB>E</SB>-0.2°C" between w2/w1 and t2/t1 in the graph. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008277643(A) 申请公布日期 2008.11.13
申请号 JP20070121388 申请日期 2007.05.02
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 SATOU RIEKO;KASATANI KAZUO;OHASHI HIROMI
分类号 H01S5/0687;H01L23/58;H01S5/022 主分类号 H01S5/0687
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