发明名称 METHOD OF FORMING A TRANSISTOR HAVING MULTIPLE TYPES OF SCHOTTKY JUNCTIONS
摘要 <p>A gate electrode (14) is formed overlying a substrate (12). A first angled metal implant is performed at a first angle into the substrate followed by performing a second angled metal implant at a second angle. The first angled metal implant and the second angled metal implant form a first current electrode (20) and a second current electrode (22). Each of the first current electrode (20) and the second current electrode (22) has at least two regions of differing metal composition. A metal layer is deposited overlying the gate electrode, the first current electrode and the second current electrode. The metal layer is annealed (30) to form two Schottky junctions in each of the first current electrode and the second current electrode. The two Schottky junctions have differing barrier levels.</p>
申请公布号 WO2008137243(A1) 申请公布日期 2008.11.13
申请号 WO2008US59739 申请日期 2008.04.09
申请人 FREESCALE SEMICONDUCTOR INC.;MIN, BYOUNG, W. 发明人 MIN, BYOUNG, W.
分类号 H01L29/812;H01L29/78 主分类号 H01L29/812
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