发明名称 RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a new resist composition and a new resist pattern forming method. <P>SOLUTION: The resist composition comprises a base material component (A) of which the solubility in an alkali developer changes by the action of an acid, and an acid generator component (B) which generates an acid upon exposure, wherein the acid generator component (B) is a polymer using an &alpha;-(un)substituted acrylic ester having a specific sulfonyl oxime in a side chain as a constitutional unit. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008275768(A) 申请公布日期 2008.11.13
申请号 JP20070117101 申请日期 2007.04.26
申请人 TOKYO OHKA KOGYO CO LTD 发明人 KAWAKAMI AKINARI;UCHIUMI YOSHIYUKI;HANEDA HIDEO
分类号 G03F7/039;G03F7/004;H01L21/027 主分类号 G03F7/039
代理机构 代理人
主权项
地址