发明名称 |
Method and Apparatus for Repairing Memory |
摘要 |
Methods and apparatuses are disclosed in which a repair instruction, such as from a tester, causes an integrated circuit undergoing testing to substitute defective locations of a first set of memory cells in the integrated circuit with a second set of memory cells in the integrated circuit, despite the repair instruction omitting the defective locations of the first set of memory cells of the integrated circuit.
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申请公布号 |
US2008282107(A1) |
申请公布日期 |
2008.11.13 |
申请号 |
US20070745244 |
申请日期 |
2007.05.07 |
申请人 |
MACRONIX INTERNATIONAL CO., LTD. |
发明人 |
HUNG CHUN-HSIUNG;CHEN HAN-SUNG;KUO NAI-PING;LO SU-CHUEH |
分类号 |
G06F11/26 |
主分类号 |
G06F11/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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