发明名称 Recess Etch for Epitaxial SiGe
摘要 A PMOS transistor and a method for fabricating a PMOS transistor. The method may include providing a semiconductor wafer having a PMOS transistor gate stack, source/drain extension regions, and active regions. The method may also include forming epi sidewalls, performing a ex-situ recess etch, and performing an in-situ recess etch. The ex-situ recess etch and the in-situ recess etch form recessed active regions. The PMOS transistor is formed by a method using ex-situ and in-situ etch and has epitaxial SiGe regions with a greatest width at the surface of the semiconductor wafer.
申请公布号 US2008277699(A1) 申请公布日期 2008.11.13
申请号 US20070747708 申请日期 2007.05.11
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 CHAKRAVARTHI SRINIVASAN;CHIDAMBARAM PERIANNAN;WEIJTMANS JOHAN
分类号 H01L29/94;H01L21/336 主分类号 H01L29/94
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