| 摘要 |
PROBLEM TO BE SOLVED: To reduce an inspection time of PLLs in a semiconductor integrated circuit loaded with a plurality of PLLs. SOLUTION: The circuit includes PLLs to the number of S (S is an integer satisfying the inequality: S≥2), and is constituted so that the (k-1)-th PLL 12<SB>(k-1)</SB>(k is an integer satisfying the inequalities: 2≤k≤S) is connected in series to the k-th PLL 12<SB>k</SB>. Hereby, PLLs to the number of S can be inspected at the first try, and the inspection time of PLLs in LSI loaded with the plurality of PLLs can be reduced. COPYRIGHT: (C)2009,JPO&INPIT
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