发明名称 Exposure Mask And Method Of Forming A Contact Hole Of A Semiconductor Device Employing The Same
摘要 An exposure mask and a method of forming a contact hole of a semiconductor device using the same, in which micro patterns can be formed are disclosed herein. In an aspect, an exposure mask method includes a mask substrate, a light-shield pattern formed on the mask substrate, and a transparent pattern in which a plurality of patterns, which are limited to the light-shield pattern and have different short-direction widths and long-direction widths, form a group which is repeatedly arranged. Accordingly, micro photoresist patterns can be formed uniformly.
申请公布号 US2008280443(A1) 申请公布日期 2008.11.13
申请号 US20070771139 申请日期 2007.06.29
申请人 YANG CHEOL HOON 发明人 YANG CHEOL HOON
分类号 H01L21/311;G03F1/00 主分类号 H01L21/311
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