摘要 |
<p>An Error Control Code (ECC) apparatus applied to a memory of a Multi-Level Cell (MLC) method may include: a bypass control signal generator generating a bypass control signal; and an ECC performing unit that may include at least two ECC decoding blocks, determining whether to bypass a portion of the at least two ECC decoding blocks based on the bypass control signal, and/or performing an ECC decoding. In addition or in the alternative, the ECC performing unit may include at least two ECC encoding blocks, determining whether to bypass a portion of the at least two ECC encoding blocks based on the bypass control signal, and/or performing an ECC encoding. An ECC method applied to a memory of a MLC method and a computer-readable recording medium storing a program for implementing an EEC method applied to a memory of a MLC method are also disclose.</p> |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KONG, JUN JIN;SONG, SEUNG-HWAN;CHAE, DONG HYUK;CHO, KYOUNG LAE;LEE, SEUNG JAE;JO, NAM PHIL;PARK, SUNG CHUNG;KANG, DONG KU |