发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which forms a line-and-space with accuracy by preventing a pattern defect from being generated during formation of a pattern. SOLUTION: The semiconductor device has at least two transistor blocks having a plurality of transistors and a plurality of gates connected to the plural transistors each. The plural gates have open-loop shapes of a substantially U shape, and the plural gates to be arranged in the transistor blocks are arranged symmetrically, with each of opening portions of the open-loop shapes facing between the two transistor blocks which are adjacent. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008277857(A) 申请公布日期 2008.11.13
申请号 JP20080166520 申请日期 2008.06.25
申请人 TOSHIBA CORP 发明人 NISHIYAMA NOBUYASU
分类号 H01L21/8247;H01L21/28;H01L21/3065;H01L27/115;H01L29/423;H01L29/49;H01L29/788;H01L29/792 主分类号 H01L21/8247
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