发明名称 Test pin, method of manufacturing same, and system containing same
摘要 A test pin includes a compression element ( 110 ), a first tip ( 120 ) physically coupled to a first end ( 111 ) of the compression element, a second tip ( 130 ) physically coupled to a second end ( 112 ) of the compression element, a first arm ( 140 ) physically coupled to a first side ( 121 ) of the first tip, and a second arm ( 150 ) physically coupled to a second side ( 122 ) of the first tip.
申请公布号 US2008278187(A1) 申请公布日期 2008.11.13
申请号 US20070800689 申请日期 2007.05.07
申请人 YAN HONGFEI;YUAN GANG 发明人 YAN HONGFEI;YUAN GANG
分类号 G01R1/067;G01R31/02;H05K3/40 主分类号 G01R1/067
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