| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem in which a test method of DUT (device under test) for incorporating ALPG (algorithmic pattern generator) function to real hardware, is difficult to rapidly respond to change and addition of a necessary ALPG function and verification thereof. SOLUTION: The virtual ALPG transmission type semiconductor test device has virtual ALPG function and real ALPG memory test function, in which a virtual ALPG operated on a hardware simulator and a real ALPG attained on hardware have the function of generating pattern at the same time by interpreting a test program although the real time is differed from each other and generate test patterns for a DUT designated by the program with a designated content at a designated speed. COPYRIGHT: (C)2009,JPO&INPIT
|
