发明名称 INSPECTED PRODUCT SELECTION METHOD AND INSPECTED PRODUCT SELECTION PROGRAM
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an inspected product selection method and an inspected product selection program, in product manufacturing for minimizing investigation man-hours when detecting a defect of the product in a market. <P>SOLUTION: A combination of product lots to be inspected is assumed from information of a material lot used for the product lot to be produced in a certain future period, and the number of the product lots inspected in the period (S3). The number of the material lots not included in the product lot to be inspected is totaled in each the product lot (S5). A statistic of the totaled value is calculated (S6). The statistic is calculated for the available combinations of all the product lots, and the combination of the product lots having the optimum statistic is decided to be inspected (S8). <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2008276434(A) 申请公布日期 2008.11.13
申请号 JP20070117957 申请日期 2007.04.27
申请人 HITACHI LTD 发明人 TANAKA MASATAKA;KUMAZAWA TAKAAKI;ICHINOHE MASAYUKI
分类号 G05B19/418 主分类号 G05B19/418
代理机构 代理人
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