发明名称 |
Negative resist composition and patterning process |
摘要 |
<p>A negative resist composition is provided comprising a polymer comprising recurring units having formula (1), an organic solvent, a crosslinker, and an optional photoacid generator. In formula (1), R<Sup>1</Sup> and R<Sup>2</Sup> are hydrogen or methyl, m is 0 or a positive integer of 1 to 5, p and q are positive numbers. The composition has a high contrast of alkali dissolution rate before and after exposure, high resolution and good etching resistance.
<Chemistry id="chema01" num="0001"><Image id="ia01" he="45" wi="149" file="IMGA0001.TIF" imgContent="chem" imgFormat="TIFF" /></Chemistry></p> |
申请公布号 |
EP1791025(A3) |
申请公布日期 |
2008.11.12 |
申请号 |
EP20060255530 |
申请日期 |
2006.10.26 |
申请人 |
SHIN-ETSU CHEMICAL CO., LTD. |
发明人 |
TAKEDA, TAKANOBU;WATANABE, OSAMU;WATANABE, SATOSHI;KOITABASHI, RYUJI;WATANABE, TAMOTSU |
分类号 |
G03F7/038 |
主分类号 |
G03F7/038 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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