发明名称 Negative resist composition and patterning process
摘要 <p>A negative resist composition is provided comprising a polymer comprising recurring units having formula (1), an organic solvent, a crosslinker, and an optional photoacid generator. In formula (1), R&lt;Sup&gt;1&lt;/Sup&gt; and R&lt;Sup&gt;2&lt;/Sup&gt; are hydrogen or methyl, m is 0 or a positive integer of 1 to 5, p and q are positive numbers. The composition has a high contrast of alkali dissolution rate before and after exposure, high resolution and good etching resistance. &lt;Chemistry id="chema01" num="0001"&gt;&lt;Image id="ia01" he="45" wi="149" file="IMGA0001.TIF" imgContent="chem" imgFormat="TIFF" /&gt;&lt;/Chemistry&gt;</p>
申请公布号 EP1791025(A3) 申请公布日期 2008.11.12
申请号 EP20060255530 申请日期 2006.10.26
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 TAKEDA, TAKANOBU;WATANABE, OSAMU;WATANABE, SATOSHI;KOITABASHI, RYUJI;WATANABE, TAMOTSU
分类号 G03F7/038 主分类号 G03F7/038
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