| 摘要 |
Disclosed are a system for and method of standardizing the frequency response of a plurality of thickness measuring radiation gauges, having resistance capacitance networks connected to the outputs thereof. Each gauge is source and zero standardized by adjusting a potentiometer in the feedback loop of an amplifier and the zero point of the amplifier, respectively. Thereafter, each gauge is frequency standardized by adjusting the time constant of frequency determining impedances. The determination of the frequency response of each gauge is made by modulating the gauge characteristics and measuring the reduction in amplitude of the gauge output relative to D.C.
|
