发明名称 NON-VOLATILE MEMORY DEVICE AND METHOD OF FABRICATING THE SAME
摘要 <p>While not forming widely interval between the word line adjacent to the select line and the select line, the word line adjacent to the select line from being program-disturbed can be prevented. A step is for forming a plurality of select lines and a plurality of word lines on a semiconductor substrate. A step is for forming the junction area in the exposed semiconductor substrate in which the select line and word line are not formed. A step is for forming the insulating layer on the select line and word line. A step is for etching selectively the insulating layer and exposing the junction area between the word line and the select line which is adjacent to the select line. A step is for forming electric charge blocking region in the exposed junction area.</p>
申请公布号 KR20080098793(A) 申请公布日期 2008.11.12
申请号 KR20070044103 申请日期 2007.05.07
申请人 HYNIX SEMICONDUCTOR INC. 发明人 OH, SANG HYUN
分类号 H01L27/115 主分类号 H01L27/115
代理机构 代理人
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