发明名称 SUBSTRATE FOR FLIP CHIP PACKAGE
摘要 The warpage of the strip level substrate caused by carrier can be prevented by positioning the reject mark for monitoring existence and/or absence of fault of each unit substrate at the ball attaching surface of each unit substrate. The board for flip-chip package comprises the strip level(30) includes a plurality of unit substrates(32), the reject mark(34) for determining existence and/or non existence of fault of each unit substrate. The reject mark has the surface for adhering the solder ball in each unit substrate.
申请公布号 KR20080098966(A) 申请公布日期 2008.11.12
申请号 KR20070044436 申请日期 2007.05.08
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, MYUNG GEUN
分类号 H01L23/544 主分类号 H01L23/544
代理机构 代理人
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