发明名称 |
HALF TONE PHASE SHIFTING MASK AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
<p>The side lobe generated in the middle part between the adjacent light-transmitting region can be prevented. The reliability and quality of the manufactured a semiconductor device can be improved. The half-tone phase shift mask comprises the transparent substrate transmitting the light; the phase inversion pattern which is formed on the transparent substrate and inverts the phase of the light; the light-shield pattern which is formed in the middle part on the phase inversion pattern and shields the light. The light-shield pattern is formed with the opaque one material. A step is for forming the phase shift layer and light-shielding layer on the transparent substrate successively. A step is for forming the first photoresist pattern at the upper part of the light-shielding layer to close only the region to be the light-shield pattern. A step is for forming the light-shield pattern by an etching process using the etching mask as the first photoresist pattern. A step is for removing first photoresist pattern. A step is for forming the second photosensitive pattern at the upper part of the phase shift layer. A step is for forming the phase inversion pattern by an etching process using the etching mask as the second photosensitive pattern. A step is for removing second photosensitive pattern.</p> |
申请公布号 |
KR20080098789(A) |
申请公布日期 |
2008.11.12 |
申请号 |
KR20070044095 |
申请日期 |
2007.05.07 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
MOON, JU HYOUNG |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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