发明名称 Method of fabricating semiconductor device
摘要 Provided is a method of fabricating a semiconductor device, the method including: forming an insulating layer on a single crystal substrate; etching the insulating layer in a predetermined pattern to expose the surface of the single crystal substrate; depositing an amorphous material on the insulating layer and the exposed surface of the single crystal substrate; and completely melting the amorphous material on the single crystal substrate and the insulating layer using laser annealing and crystallizing the melted amorphous material. The semiconductor device has a single crystalline silicon gate on the insulating layer.
申请公布号 US7449402(B2) 申请公布日期 2008.11.11
申请号 US20060336802 申请日期 2006.01.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HEO SOO-BONG;CHOI CHEL-JONG
分类号 H01L21/336 主分类号 H01L21/336
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