发明名称 |
Probe for testing an electrical device |
摘要 |
A probe having a first and a second arm portion extending between first and second connecting portions connecting the first and second arm portions respectively at their front end portion and base end portion, and a needle point portion below the first connecting portion. At least one of the entire first and second arm portions or the upper or lower edge portions of the first and second arm portions are arcuate.
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申请公布号 |
US7449906(B2) |
申请公布日期 |
2008.11.11 |
申请号 |
US20030556436 |
申请日期 |
2003.08.29 |
申请人 |
KABUSHIKI KAISHA NIHON MICRONICS |
发明人 |
MIURA KIYOTOSHI;MIYAGI YUJI;AKAHIRA AKIHISA |
分类号 |
G01R31/02;G01R1/067;G01R31/26;H01L21/66 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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